Patent · US Expired

Method and a measuring circuit for determining temperature from a PN junction temperature sensor, and a temperature sensing circuit comprising the measuring circuit and a PN junction

US7010440B1 · kind B1 · utility

52Cited by
9References
59Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 25, 2003
Grant dateMar 7, 2006
Priority date
Expiry dateJul 16, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K7/01
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A switched current temperature sensing circuit (1) comprises a measuring transistor (Q1) which is located remotely of a measuring circuit (5) which applies three excitation currents (I1,I2,I3) of different values to the measuring transistor (Q1) in a predetermined current sequence along lines (10,11). Resulting base/emitter voltages from the measuring transistor (Q1) are applied to the measuring circuit (5) along the same two lines (10,11) as the excitation currents are applied to the measuring transistor (Q1). Voltage differences ΔVbe of successive base/emitter voltages resulting from the excitation currents are integrated in an integrating circuit (36) of the measuring circuit (5) to provide an output voltage indicative of the temperature of the measuring transistor (Q1). By virtue of the fact that the measuring transistor (Q1) is excited by excitation currents of three different values, the effect of current path series resistance in the lines (10,11) on the output voltage indicative of temperature is eliminated. The predetermined current sequence in which the excitation currents are applied to the measuring transistor (Q1) is selected to minimize the voltages in the integrating…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.