Patent · US Expired

Formation testing apparatus and method for optimizing draw down

US7011155B2 · kind B2 · utility

23Cited by
16References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 25, 2003
Grant dateMar 14, 2006
Priority date
Expiry dateApr 25, 2023

Classification

  • Technology area (CPC E)Fixed Constructions
  • CPC primaryE21B49/0875
  • WIPO fieldCivil engineering
  • WIPO sectorOther fields

Abstract

A method and apparatus for of determining a formation parameter of interest. The method includes placing a tool into communication with the formation to test the formation, determining a first formation characteristic during a first test portion, initiating a second test portion, the second test portion having test parameters determined at least in part by the determinations made during the first test portion, determining a second formation characteristic during the second test portion, and determining the formation parameter from one of the first formation characteristic and the second formation characteristic. The apparatus includes a draw down unit and a control system for closed loop control of the draw down unit. A microprocessor in the control system processes signals from a sensor in the draw down unit to determine formation characteristics and to determine test parameters for subsequent test portions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.