High capacity and scanning speed system for sample handling and analysis
US7012249B2 · kind B2 · utility
12Cited by
6References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2004 |
| Grant date | Mar 14, 2006 |
| Priority date | — |
| Expiry date | Aug 23, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/1041
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is an apparatus for examining and inspecting at least one sample in order to determine characteristics of the sample having the a support for receiving a compact disc, the compact disc having deposited on a surface thereof at least one sample, inspection means for effecting a physical change in at least one sample, the inspection means positioned for registration with the surface of the compact disc bearing at least one sample; and a traversal mechanism adapted for reciprocating movement, to move the sample in and out of the path of the inspection means.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.