Patent · US Expired

High throughput preparation and analysis of plastically shaped material samples

US7013709B2 · kind B2 · utility

61Cited by
129References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 6, 2002
Grant dateMar 21, 2006
Priority date
Expiry dateNov 22, 2023

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC40B40/00
  • WIPO fieldOrganic fine chemistry
  • WIPO sectorChemistry

Abstract

A rapid throughput method for the preparation, analysis or both of libraries of material samples is provided. According to the method, a plurality of samples is provided. The plurality of samples is then formed into a plurality of films. Thereafter, the plurality of films is plastically deformed. Preferably, the plurality of films is deformed into a configuration appropriate for testing of properties or characteristics of the samples.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.