Patent · US Expired

Method and apparatus for measuring, analyzing, and characterizing irregularities on a surface of an article

US7013716B1 · kind B1 · utility

0Cited by
7References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 29, 2002
Grant dateMar 21, 2006
Priority date
Expiry dateJul 29, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/303
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A surface capacity parameter is determined for a surface of an article having irregularities therein that can be characterized by peaks and valleys relative to a reference point. Initially, an area of interest on the surface of the article and a lateral resolution of that area of interest are determined. An apparatus generates a visual representation of the area of interest on the surface of the article. A deflection contact part factor for the article is calculated, and a bearing ratio curve level is determined based upon the calculated deflection contact part factor and the magnitude of the height or distance between the tallest peak and the lowest valley on the surface of the article. The volume of the material comprising the peaks in the surface of the article and the volume of the space in the surface of the article that is available for the retention of a fluid, such as a lubricant, are determined. Lastly, a surface capacity parameter is calculated as the ratio of the volume of the material comprising the peaks in the surface of the article to the volume of the volume of the space comprising the valleys in the surface of the article.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.