Patent · US Expired

Laser scanning microscope, semiconductor laser light source unit, scanning unit for a laser scanning microscope, and method of connecting semiconductor light source to scanning microscope

US7015485B2 · kind B2 · utility

12Cited by
10References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 23, 2003
Grant dateMar 21, 2006
Priority date
Expiry dateJan 11, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/6458
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A laser scanning microscope according to the present invention is a laser scanning microscope which scans a laser beam on a sample by a scanning optical system in a scanning optical system main body to detect a fluorescence or reflected light from the sample, and a light source section comprising a light source manufactured by a semiconductor process and an optical fiber provided on a radiation side of the light source is incorporated in the scanning optical system main body.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.