Connection method for probe pins for measurement of characteristics of thin-film magnetic head and characteristic measurement method for thin-film magnetic head
US7015689B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2003 |
| Grant date | Mar 21, 2006 |
| Priority date | — |
| Expiry date | May 19, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/4806
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of connecting a plurality of probe pins to a plurality of first external connection pads, which are provided on a head gimbal assembly and are electrically connected to a plurality of terminal electrodes of a write magnetic head element, respectively, and a plurality of second external connection pads, which are provided on the head gimbal assembly and are electrically connected to a plurality of terminal electrodes of a read magnetic head element. In the connection method, an approach direction of the probe pins to the first external connection pads and an approach direction of the probe pins to the second external connection pads are made different from each other.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.