Patent · US Expired

Flaw detector

US7015700B2 · kind B2 · utility

2Cited by

4References

3Claims

0Family size

Assignee

Tetra Laval Holdings & Finance S.A. · CH

Inventors

Hidetoshi Konno · Yokohama, JP
Yasuyuki Moriyama · Nagareyama, JP
Michio Sugata · Moriyama, JP

Key dates

Filing date	Dec 26, 2001
Grant date	Mar 21, 2006
Priority date	—
Expiry date	Nov 13, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG01N33/0081
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Flaw detection apparatus includes an electrode disposed in a region surrounded by a packaging material including a layer of an electrically-conductive material; a cutting member made of an electrically-conductive material and adapted to cut a predetermined portion of the packaging material; a variable detector, disposed between the electrode and the cutting member, for detecting an electrical variable; and flaw detection processor for reading the detected variable and for determining, on the basis of the detected variable, a flaw in the packaging material. In this case, the variable detector is disposed between the electrode and the cutting member.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.