Patent · US Expired

Bond testing system, method, and apparatus

US7017422B2 · kind B2 · utility

21Cited by
21References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 2, 2004
Grant dateMar 28, 2006
Priority date
Expiry dateApr 2, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/267
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A bond strength tester and method for determining certain bond strength parameters of a bonded component, including a phaselocker, a transducer, a loading device that is capable of applying stress-loads to the bond, a controller for controlling the loading device, a data recording device to acquire data, and a computer device to analyze data calculating certain bond strength parameters.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.