Transmission line input structure test probe
US7019544B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 22, 2004 |
| Grant date | Mar 28, 2006 |
| Priority date | — |
| Expiry date | Nov 22, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06772
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A differential electrical test probe tip for sensing a plurality of electric signals and generating a differential signal including an elongate common substrate having a two signal test points at one end and a differential amplifier at the second end. Two transmission lines are on the common substrate, each connecting a respective signal test point a signal input of the differential amplifier. The characteristic impedances of the two transmission lines are substantially equal. In one preferred embodiment, the common substrate is a flexible substrate. In one preferred embodiment an over-mold, which may have gaps therein, at least partially encloses the common substrate, the first transmission line, and the second transmission line.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.