Patent · US Expired

Position measuring device

US7019842B2 · kind B2 · utility

28Cited by

5References

18Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Wolfgang Holzapfel · Obing, DE
Andreas Schreiber · Birstein, DE

Key dates

Filing date	Sep 8, 2001
Grant date	Mar 28, 2006
Priority date	—
Expiry date	Aug 3, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG01D5/38
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A position measuring device for detecting the relative position of a scanning unit and a scale. The position measuring device includes a scale and a scanning unit that is displaced with respect to the scale in a measuring direction. The scanning unit includes a scanning grating, a ridge prism and an optoelectronic detector element. The ridge prism having a ridge that is oriented parallel with the measuring direction, the ridge prism acts as a retro-reflector in a second direction which is aligned in a plane of the scale vertically with respect to the measuring direction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.