X-ray inspection system
US7020242B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 6, 2004 |
| Grant date | Mar 28, 2006 |
| Priority date | — |
| Expiry date | Aug 6, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/271
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray inspection system and methodology is disclosed. The system comprises a conveyor, an X-ray source that exposes an item under inspection to X-ray radiation and at least one X-ray detector that detects X-ray radiation modified by the item. The X-ray source and X-ray detector may be movable in any of first and second dimensions. The X-ray source may also be moved in a third dimension to zoom in and out on regions of interest in the item order inspection. The system further comprises a controller that controls movement of the X-ray source and X-ray detector, independently of each other, in any of collinear and different directions, to provide a plurality of X-ray views of the item at varying examination angles of the X-ray radiation. A processor coupled to the controller may be configured to receive and process detection information from the X-ray detector and to provide processed information to an operator interface. The operator interface may also receive instructions from an operator input and provide the instructions to the controller.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.