Patent · US Expired

Apparatus and method for testing subscriber loop interface circuits

US7020248B2 · kind B2 · utility

0Cited by
4References
5Claims
0Family size

Inventor

Key dates

Filing dateFeb 21, 2002
Grant dateMar 28, 2006
Priority date—
Expiry dateFeb 21, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04M3/2272
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for internally testing portions of a subscriber loop interface circuit. Testing may be conducted on a semiconductor circuit including the subscriber loop interface circuit. The portion of the subscriber loop interface circuit being tested may be the ring trip detector and/or the off-hook detect circuit. Testing may be conducted without disabling the capability of the subscriber loop interface circuit to monitor the hook status of a subscriber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.