System and method of measuring a signal propagation delay
US7020567B2 · kind B2 · utility
21Cited by
14References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 28, 2003 |
| Grant date | Mar 28, 2006 |
| Priority date | — |
| Expiry date | Apr 22, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/07
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
The present invention relates generally to an improvement in the ability of test systems to test bit processing capacities of electronic devices, and in particular an improvement in their ability to measure a signal propagation delay through an object connected to an optoelectronic device. The present invention includes determining for how long after a specific bit or bit group is transmitted by an optical transceiver the bit or bit group is received at the other end of the object connected to the optical transceiver.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.