Patent · US Expired

Rinse apparatus and method for wafer polisher

US7021999B2 · kind B2 · utility

8Cited by
8References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 5, 2005
Grant dateApr 4, 2006
Priority date
Expiry dateApr 5, 2025

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B53/017
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

An apparatus for polishing a wafer comprising a rotatable polishing pad having a center of rotation and a rinse delivery conduit positioned adjacent to the polishing pad and substantially in radial alignment with the center. The rinse delivery conduit includes a plurality of nozzles to dispense a rinsing liquid. In one embodiment, the plurality of nozzles are configured and positioned to generate a higher flow rate of the rinsing liquid at the end of the rinse delivery conduit proximate to the center than at the end of the rinse delivery conduit distal to the center. In another embodiment, the rinse delivery conduit has a proximal end which is substantially adjacent the center and the distal end which is approximately adjacent an outer periphery of the pad.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.