Patent · US Expired

Methods and systems for alignment of detection optics

US7023007B2 · kind B2 · utility

118Cited by
7References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 16, 2003
Grant dateApr 4, 2006
Priority date
Expiry dateJan 4, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/6482
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention provides methods and systems for aligning detection optics with a device by obtaining an optical profile of the system and comparing it with a preprogrammed layout of the various optical features of the device. The invention also provides methods of identifying devices by comparing the optical profile with a library of preprogrammed optical profiles of multiple devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.