Method and device for the geometrical measurement of a material strip
US7026620B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 22, 2004 |
| Grant date | Apr 11, 2006 |
| Priority date | — |
| Expiry date | Mar 22, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for the geometrical measurement of a material strip (2), whereby the material strip (2) defines a longitudinal direction, whereby, by means of a first measuring device with at least one radiation source (6) and with at least one detector (8), the strip thickness of the material strip (2) is determined, whereby for this purpose the radiation (10) from the radiation source (6) penetrates the material strip (2) at at least one measurement point (12) arranged in the material strip (2), and the resultant weakening of the intensity of the radiation (10) is determined by the corresponding detector (8). It is proposed that, by means of a second measuring device, the transverse contour of the material strip (2) is determined. In this situation, the measurement of the strip thickness and the transverse contour is effected at the same place on the material strip. The measured values of the thickness measurement are corrected with the measured values of the transverse contour.The invention also relates to a device for the performance of the method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.