Digital-to-analog converter comprising an integrated test circuit
US7026966B2 · kind B2 · utility
5Cited by
16References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 13, 2002 |
| Grant date | Apr 11, 2006 |
| Priority date | — |
| Expiry date | May 13, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/66
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
In a digital-to-analog converter including an integrated test circuit, a digital input and an analog output, a comparator (5) capable of being connected with the analog output (4) and including a connection (7) for a reference voltage source, a digital test connection (11) and a logic element is provided, the logic element being connected with the test connection (11) for emitting the digital value 0 or 1 as a function of the difference between the voltage at the analog output (4) and the reference voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.