Patent · US Expired

Method and circuit for detecting a fault of semiconductor circuit elements and use thereof in electronic regulators of braking force and of dynamics movement of vehicles

US7027939B2 · kind B2 · utility

6Cited by

18References

6Claims

0Family size

Assignee

Continental Teves AG & Co. OHG · DE

Inventors

Wolfgang Fey · Niedernhausen, DE
Mario Engelmann · Rheinböllen, DE
Peter Oehler · Scheinfeld, DE

Key dates

Filing date	Oct 24, 2002
Grant date	Apr 11, 2006
Priority date	—
Expiry date	Oct 24, 2022

Classification

Technology area (CPC H)Electricity
CPC primaryH03K2217/0027
WIPO fieldTransport
WIPO sectorMechanical engineering

Abstract

A circuit for detecting a defect of electronic components in an electronic control unit includes an output for driving a load (3). A redundant measurement of the current (IL) is executed at the contacts (G, S, D), in particular at the driven contacts (S, D), of one or more semiconductor circuit elements, and an error function of a semiconductor circuit element is detected when the comparison of two current values (IS, ISense1, ISense2) by way of the current flowing through a load (3, 3′) indicates an unequal current distribution. This circuit is of use in electronic brake force or driving dynamics controllers for motor vehicles.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.