Multi-channel buffered serial port debugging
US7028118B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 27, 2002 |
| Grant date | Apr 11, 2006 |
| Priority date | — |
| Expiry date | Oct 19, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F13/376
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In digital signal processors serial data is passed in out and of the chip in a time division multiplexed (TDM) fashion. The TDM stream consists of many independent channels of serial data. The complexity of generating interleaved TDM serial data from multiple sources particularly in the case of multi-processor systems. This process is normally driven by a program resident on each processor. The proper sequencing of the TDM serial stream must be tested prior to making the multi-processor device ready for its application. This invention describes the use of minimal added hardware and a single output pin allowing the test and debug of program errors or device malfunctions in output serial data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.