Accurate testing of temperature measurement unit
US7030793B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 18, 2004 |
| Grant date | Apr 18, 2006 |
| Priority date | — |
| Expiry date | Jun 30, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various embodiments of a method and apparatus for simulating temperature characteristics of a diode are disclosed. The output of a diode simulator may not depend upon its ambient temperature. Therefore, it may be used to calibrate a temperature measurement unit at any ambient temperature within its operational range regardless of the temperature to which the temperature measurement unit is to be calibrated. Even if the ambient temperature of the facility in which the calibration is performed varies during the calibration procedure, the output of the diode simulator may remain constant. These characteristics of the diode simulator may allow for calibration of a temperature measurement unit in significantly less time than by using prior art methods, which include the requirement to tightly control the temperature of one or more system components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.