Interactive system for analyzing scatter plots
US7031528B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 6, 2003 |
| Grant date | Apr 18, 2006 |
| Priority date | — |
| Expiry date | Nov 11, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16B25/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanner system analyses data plotted in a scatter plot in accordance with user-specified criteria or statistical measures from the data population, to produce a scatter plot that displays in the plotted data the boundaries for the selection of out-lyer points and/or otherwise visually denotes in the plotted data which points are the out-lyer points. The scanner system analyzes the underlying data based on user-specified differential expression ratios, or based on criteria associated with the statistics of the data population, to produce out-lyer boundaries that are represented by diverging lines. Alternatively, the system may analyze the underlying data based on absolute expression levels, to produce boundaries that are represented in the plot by lines that meet at an identity line of slope 1. The scanner system may also combine several criteria and produce boundaries that denote as out-lyers the data that, for example, show both sufficient differential expression and also include individual expressions that are sufficiently above an associated noise floor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.