High throughput screening with parallel vibrational spectroscopy
US7033542B2 · kind B2 · utility
16Cited by
24References
32Claims
0Family size
Inventors
Key dates
| Filing date | Feb 14, 2003 |
| Grant date | Apr 25, 2006 |
| Priority date | — |
| Expiry date | May 11, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/7703
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Rapid spectrum assay of multiple samples with infrared light is made possible by devices and methods that increase total light throughput. Multiple wavelength scan with Fourier analysis is combined with large numbers of sample wells located within infrared light compatible solid materials. In particular, very large scale measurement devices and systems for their use are fabricated from lithography and other techniques used for semiconductor processing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.