Pixel defect correction in a CMOS active pixel image sensor
US7034873B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2001 |
| Grant date | Apr 25, 2006 |
| Priority date | — |
| Expiry date | Jul 2, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/68
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Effectively defect free images are obtained from CMOS image sensors through a two step method in which the addresses of bad pixels are recorded during sensor testing and stored in an on-chip directory. Then, during sensor readout, each pixel address is checked to determine if it represents that of a bad pixel. If this is determined to be the case, the bad pixel value is replaced by another value. This replacement value is generated from an average of the nearest-neighbors that are not defective. If testing is performed at the wafer level, said bad pixel and nearest neighbor data may be used to modify the final level wiring so that bad pixels are disconnected and replaced by their nearest neighbors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.