Fourier transform spectrometry with a multi-aperture interferometer
US7034945B2 · kind B2 · utility
8Cited by
3References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 25, 2003 |
| Grant date | Apr 25, 2006 |
| Priority date | — |
| Expiry date | Jul 21, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/453
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrometer configured to extract spectral information from a wavefront. The spectrometer includes a first collection device that includes an adjustable-optical path and configured to collect a first portion of a wavefront; a second collection device configured to collect a second portion of the wavefront; combiner optics configured to interfere the first and second portions of the wavefront at an image plane of the first and second collector devices to form interference patterns at the image plane; and a Fourier transformation module configured to derive spectral information from the interference patterns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.