X-ray examination apparatus and method
US7035376B2 · kind B2 · utility
0Cited by
3References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 2, 2002 |
| Grant date | Apr 25, 2006 |
| Priority date | — |
| Expiry date | Dec 30, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/44
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
An X-ray examination apparatus and method that provides fast and accurate control of the X-ray dose by combining a fast and inaccurate sensor dose signal for an X-ray sensor and a slow and accurate detector dose signal from an X-ray detector. The combination of the signals takes into account the delay between the two signals so that they are measured at essentially the same time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.