System and method for probabilistic exemplar-based pattern tracking
US7035431B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 22, 2002 |
| Grant date | Apr 25, 2006 |
| Priority date | — |
| Expiry date | Mar 11, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/62
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention involves a new system and method for probabilistic exemplar-based tracking of patterns or objects. Tracking is accomplished by first extracting a set of exemplars from training data. The exemplars are then clustered using conventional statistical techniques. Such clustering techniques include k-medoids clustering which is based on a distance function for determining the distance or similarity between the exemplars. A dimensionality for each exemplar cluster is then estimated and used for generating a probabilistic likelihood function for each exemplar cluster. Any of a number of conventional tracking algorithms is then used in combination with the exemplars and the probabilistic likelihood functions for tracking patterns or objects in a sequence of images, or in a space, or frequency domain.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.