On-chip signal state duration measurement and adjustment
US7036098B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2003 |
| Grant date | Apr 25, 2006 |
| Priority date | — |
| Expiry date | Jan 20, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31725
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Signal state durations, such as the pulse-width, of on-chip signals are often critical to the successful operation of an integrated circuit. The signal state durations measured by on-chip technology provide signal state duration information to an on-chip signal state duration control system. The signal state duration control system uses the information to adjust the signal state duration of an on-chip signal. In one embodiment, the signal state duration of the on-chip signal is the pulse width of the on-chip signal. The signal duration measurement and adjustment system is, for example, useful for measuring the state duration of signals such as self-resetting signals, which are difficult to externally measure and adjust signal state durations using on-chip technology.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.