Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
US7038208B2 · kind B2 · utility
5Cited by
1References
23Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Sep 2, 2003 |
| Grant date | May 2, 2006 |
| Priority date | — |
| Expiry date | Nov 9, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8422
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) illumination unit for illuminating an area of the coated surface, and an MIR 2-D imager, which includes an MIR CCD or CMOS camera, for capturing an image of a material abnormalities under the illuminated area of the coated surface. In addition, the system may further comprise a scanning unit for moving the system to a next area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.