Non-planarized, self-aligned, non-volatile phase-change memory array and method of formation
US7038231B2 · kind B2 · utility
9Cited by
22References
36Claims
0Family size
Assignee
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Key dates
| Filing date | Apr 30, 2004 |
| Grant date | May 2, 2006 |
| Priority date | — |
| Expiry date | May 15, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10N70/8828
Abstract
A method for fabrication and a structure of a self-aligned (crosspoint) memory device comprises lines (wires) in a first direction and in a second direction. The wires in the first direction are formed using a hard mask material that is resistant to the pre-selected etch processes used for creation of the lines in both the first and the second direction. Consequently, the hard mask material for the lines in the first direction form part of the memory stack.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.