Patent · US Expired

Method and apparatus for high update rate integrated circuit boundary scan

US7039840B2 · kind B2 · utility

1Cited by
2References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 9, 2003
Grant dateMay 2, 2006
Priority date—
Expiry dateJul 31, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318541
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Boundary scan cells for driving internal logic and sensing internal logic of integrated circuit use external clocks synchronized with internal functional clocks. Synchronized clocks enable synchronous sampling of internal signals and synchronized of injection signals into a functional portion of the integrated circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.