Process meter
US7040179B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 8, 2003 |
| Grant date | May 9, 2006 |
| Priority date | — |
| Expiry date | Jan 28, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01F15/024
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A process meter for measuring at least one physical process variable of a medium stored in a container or flowing in a line, comprising: a transducer including a sensor arrangement providing measurement signals (s1, s2), said sensor arrangement having: at least a first sensor providing at least a first measurement signal (s1) in response to the physical process variable being measured, particularly to changes in the process variable, and at least a first temperature sensor mounted in said transducer for locally sensing a first temperature, T1, in the transducer, and by means of said at least one temperature sensor, at least a first temperature measurement signal (Θ1) representing the first temperature, T1, in said transducer; and meter electronics which, using at least said first measurement signal (s1) and a first correction value (K1) for the at least first measurement signal (s1), derive at least one measured value (X) currently representing the physical variable, wherein: during operation, said meter electronics determine the first correction value (K1) from a temporal variation of the at least first temperature measurement signal (Θ1) by also taking into account temperature va…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.