Patent · US Expired

Process meter

US7040179B2 · kind B2 · utility

29Cited by
5References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 8, 2003
Grant dateMay 9, 2006
Priority date
Expiry dateJan 28, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01F15/024
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A process meter for measuring at least one physical process variable of a medium stored in a container or flowing in a line, comprising: a transducer including a sensor arrangement providing measurement signals (s1, s2), said sensor arrangement having: at least a first sensor providing at least a first measurement signal (s1) in response to the physical process variable being measured, particularly to changes in the process variable, and at least a first temperature sensor mounted in said transducer for locally sensing a first temperature, T1, in the transducer, and by means of said at least one temperature sensor, at least a first temperature measurement signal (Θ1) representing the first temperature, T1, in said transducer; and meter electronics which, using at least said first measurement signal (s1) and a first correction value (K1) for the at least first measurement signal (s1), derive at least one measured value (X) currently representing the physical variable, wherein: during operation, said meter electronics determine the first correction value (K1) from a temporal variation of the at least first temperature measurement signal (Θ1) by also taking into account temperature va…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.