Radiation-emitting semiconductor component
US7042013B2 · kind B2 · utility
2Cited by
4References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 22, 2003 |
| Grant date | May 9, 2006 |
| Priority date | — |
| Expiry date | Sep 8, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10H20/811
Abstract
A radiation-emitting semiconductor component having a layer structure which contains an n-doped cladding layer (18), a p-doped cladding layer (20), and an active layer (14) based on InGaAlP arranged between the n-doped cladding layer (18) and the p-doped cladding layer (20). A diffusion stop layer (16) is arranged between the active layer (14) and the p-doped cladding layer (20). The diffusion stop layer (16) is formed by a strained superlattice.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.