Time domain electromagnetic analysis and inspection system for conduits
US7042223B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 2, 2003 |
| Grant date | May 9, 2006 |
| Priority date | — |
| Expiry date | Feb 16, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/902
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of inspecting a conduit and a conduit inspection device are disclosed. The method relates to producing a primary magnetic field to induce a current in the conduit so that the currents produce a decaying secondary magnetic field influenced by the conduit. The secondary magnetic field is analysed by time domain analysis to provide an indication of the state of the conduit. The device which produces the primary magnetic field can be moved relative to the conduit so that the secondary magnetic field is detected at different positions along the conduit so that the state of the conduit at various positions along the conduit can be determined. The device for producing the primary magnetic field comprises a transmitter having at least one winding and a detector for detecting the secondary magnetic field comprising at least one inductor coil. A storage is provided for storing the data detected by the inductor coil and is coupled to the conductor coil by a communication link.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.