Systems and methods for inspecting an optical interface

US7042562B2 · kind B2 · utility

Assignee

• Amphenol Corporation · US

Inventors

• Sepehr Kiani · Cambridge, US
• David Gessel · San Francisco, US
• Andrew W. Wilson · Fremont, US

Key dates

• Filing date: Dec 26, 2002
• Grant date: May 9, 2006
• Expiry date: Aug 9, 2023

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B6/3897
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A system enables inspection of an optical connector. The system includes a positioning subassembly, an electronic sensor (e.g., a scanner, a camera, etc.), and a controller coupled to the positioning subassembly and the electronic sensor. The controller is configured to position the electronic sensor over the optical connector, activate the electronic sensor to obtain a set of electronic signals which defines a set of current images of the optical connector, and electronically generate a result based on the set of electronic signals. The result indicates an attribute of the optical connector. Accordingly, the system is capable of inspecting the optical connector in a repeatable and non-subjective manner.