Porous thin film time-varying reflectivity analysis of samples
US7042570B2 · kind B2 · utility
21Cited by
10References
56Claims
0Family size
Assignee
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Key dates
| Filing date | Jan 9, 2003 |
| Grant date | May 9, 2006 |
| Priority date | — |
| Expiry date | Jan 17, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/7773
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for analyzing gaseous or liquid samples is provided. Samples are interacted with pores of a porous thin film. A time-varying response of reflectivity is obtained from the surface of the porous thin film during the interaction. One or more analytes forming the sample or a part of the sample are identified based upon the time-varying response.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.