Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects
US7042573B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 18, 2004 |
| Grant date | May 9, 2006 |
| Priority date | — |
| Expiry date | Nov 18, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/3181
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In order to characterize the optical characteristics of a device, a source of light having a variable frequency with a polarization state which varies linearly with frequency is provided as an input to the device under test. The input light is also passed through a known reference path and is added to the light output from the device under test in a beam combiner. The combined light for the frequencies of interest is split into two orthogonal polarizations which are then detected in a spectral acquisition apparatus and supplied to a microprocessor. The spectral measurements are digitized and curve-fitted to provide optical power versus optical frequency curves. Fourier transforms of each of the curves are calculated by the microprocessor. From the Fourier transforms, the four arrays of constants are calculated for the Jones matrix characterizing the device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.