Patent · US Expired

Temperature probe and its use

US7046116B2 · kind B2 · utility

4Cited by

13References

10Claims

0Family size

Assignee

Heraeus Sensor Technology GmbH · DE

Inventors

Gerhard Damaschke · Flörsheim, DE
Bruno Rudnizki · Geiselbach, DE

Key dates

Filing date	Nov 10, 2003
Grant date	May 16, 2006
Priority date	—
Expiry date	Nov 10, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG01K7/183
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A temperature probe is provided having a sensor element formed from a ceramic substrate and a platinum thin-film resistor arranged thereon. The platinum thin-film resistor is electrically connected with at least two terminal wires, with the at least two terminal wires each being electrically and mechanically connected with a contact pin in a connection area on their side facing away from the sensor element. The diameter of the terminal wires is smaller than the diameter of the contact pins, and the connection area is covered by a glass bead. Use of the temperature probe in a temperature range of about −70° C. to +600° C. is ideal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.