Patent · US Expired

Method and apparatus for testing a storage interface

US7047460B1 · kind B1 · utility

3Cited by
0References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 24, 2002
Grant dateMay 16, 2006
Priority date
Expiry dateMar 21, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/261
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A tester or method of testing a mass storage interface queues error functions for simulation responsive to condition criteria of such storage simulation. Such bridge-chip tester may comprise ATA registers to receive data from an ATA or ATAPI-type interface. A main access emulator may emulate data storage processes responsive to commands of a command register of the ATA registers. A test controller may be operable to load a queue with predetermined error functions to be emulated by the tester. The queue may release error functions of the queue for emulation responsive to data of at least one of the command register and the emulator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.