Apparatus and method for programmable fuse repair to support dynamic relocate and improved cache testing
US7047466B2 · kind B2 · utility
15Cited by
2References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 3, 2002 |
| Grant date | May 16, 2006 |
| Priority date | — |
| Expiry date | Aug 26, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318541
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for allowing for dynamic wordline repair in a clock running system in addition to allowing for programmable fuse support of combined Array Built-In Self-Test (ABIST) and Logic Built-In Self-Test (LBIST) testing. The method makes use of programmable fuses which contain Level Sensitive Scan Design (LSSD) latches which also have a system port. The system port allows for simpler reading of the fuses as well as for the dynamic updates of the programmable fuses for wordline and other repairs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.