Patent · US Expired

Testing of samples

US7047819B2 · kind B2 · utility

4Cited by
10References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 10, 2003
Grant dateMay 23, 2006
Priority date
Expiry dateOct 10, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0647
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Test apparatus comprising means for holding a sample to be tested, means for altering the strain in the sample, an optical arrangement for monitoring the sample to be tested, and processing means for processing the signals resulting from the monitoring of the sample under test, wherein the environment between the optical arrangement and the sample under test is controlled, and wherein the sample to be tested is located in a position external to the controlled environment.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.