Methods, apparatus, and software for adjusting the focal spot of an electron beam
US7049616B2 · kind B2 · utility
1Cited by
5References
28Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 17, 2004 |
| Grant date | May 23, 2006 |
| Priority date | — |
| Expiry date | Aug 28, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J35/30
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method of adjusting a beam spot width includes scanning a phantom with an electron beam having a beam spot width to obtain data; and adjusting the beam spot width using the obtained data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.