Test circuit having parallel drive segments and a plurality of sense elements

US7049811B2 · kind B2 · utility

Assignee

• JENTEK Sensors, Inc. · US

Inventors

• Darrell E. Schlicker · Watertown, US
• Neil J. Goldfine · Newton, US
• Andrew P. Washabaugh · Chula Vista, US
• Karen E. Walrath · Arlington, US
• Ian Shay · Cambridge, US
• David C. Grundy · Reading, US
• Mark Windoloski · Chelmsford, US

Key dates

• Filing date: Jun 23, 2004
• Grant date: May 23, 2006
• Expiry date: Jun 23, 2024

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N27/904
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A test circuit having a drive winding with parallel conducting segments and a plurality of sense elements used for the nondestructive measurement of materials. The drive winding segments have extended portions and are driven by a time varying electric current to impose a magnetic field in the test material. Sense elements are distributed in a direction parallel to the extended portions of these drive segments, with separate connections provided to each sense element. A second plurality of sense elements may also be distributed parallel to the extended portions of the drive windings, being either aligned or offset from a first plurality of sense elements.