Method and apparatus for the spatially-resolved determination of the element concentrations in objects to be examined
US7050530B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 5, 2004 |
| Grant date | May 23, 2006 |
| Priority date | — |
| Expiry date | Nov 5, 2024 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/4035
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is proposed for the spatially-resolved determination of the concentration of n elements and/or element combinations in an object to be examined that includes these elements and/or element combinations. In the method, use is made of an X-ray installation to record a number of digital X-ray images of at least one region of the object to be examined with the aid of m≧n different spectral distributions of the X-radiation S(E) and/or of the detector sensitivity D(E), in order to obtain m attenuation values for each pixel representing the same location in the X-ray images. The concentrations of the n elements and/or element combinations are then calculated for at least one pixel from the respective m attenuation values while taking account of known spectral absorption spectra of the n elements and/or element combinations and of the m different spectral distributions of the X-radiation and/or of the detector sensitivity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.