Failure prediction apparatus and method
US7050936B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 30, 2001 |
| Grant date | May 23, 2006 |
| Priority date | — |
| Expiry date | Jun 15, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/008
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An apparatus and method for predicting failure in a system is provided having a measurement unit for repeatedly measuring a disorder indicator of the system, and a comparator for comparing obtained measurements of the disorder indicator with a predetermined statistical description of the disorder indicator. The comparison is used to determine whether a deviation is present between presently measured values of the disorder indicator and the statistical description. The apparatus issues a failure prediction upon determination of the presence of such a deviation. The apparatus is able to use routine monitoring of the system and relies on its own statistical analysis of the behavior of the disorder indicator, to provide fault prediction which is non-specific to the type of fault.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.