Method for reducing dark current for an array of active pixel sensor cells
US7053354B1 · kind B1 · utility
4Cited by
9References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 24, 2004 |
| Grant date | May 30, 2006 |
| Priority date | — |
| Expiry date | Sep 25, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/802
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An array of active pixel sensor cells is operated to substantially reduce the gate induced drain leakage (GIDL) current component of the dark current. In addition, the array is tested to determine the number of cells in the array that are bad, and discards the array of active pixel sensor cells when the number of bad cells exceeds a predefined limit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.