Patent · US Expired

Methods and systems for analyzing flutter test data using non-linear transfer function frequency response fitting

US7054785B2 · kind B2 · utility

2Cited by
8References
22Claims
0Family size

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Inventor

Key dates

Filing dateJun 24, 2003
Grant dateMay 30, 2006
Priority date
Expiry dateNov 19, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M5/0066
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Methods and systems for analyzing flutter test data using non-linear transfer function frequency response fitting are provided. In one embodiment, a plurality of data points are read, with each data point representing a motion of an aeroelastic structure (e.g. an aircraft surface) at a different location. A closed form fit to the plurality of data points is performed to obtain an initial curve fit condition. At least one non-linear transfer function frequency response curve fit is then performed to the plurality of data points.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.