Alignment pattern detecting sensor, method of determining acceptance width of the alignment pattern detecting sensor, method of forming alignment pattern, and image forming apparatus
US7055928B2 · kind B2 · utility
6Cited by
19References
36Claims
0Family size
Assignee
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Key dates
| Filing date | Nov 28, 2003 |
| Grant date | Jun 6, 2006 |
| Priority date | — |
| Expiry date | Aug 2, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G2215/0161
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An image forming apparatus includes an alignment pattern and an alignment pattern detector that detects the alignment pattern. The alignment pattern is formed in such a manner that a line image of a reference color and a line image of a color other than the reference color are superposed on each other with a predetermined shift amount. An acceptance width of the alignment pattern detector is determined so that the acceptance width satisfies a relation with a writing density of the image forming apparatus and a line width of the alignment pattern, as follows:[acceptance width]>[line width]/(5.0627×[writing density (dpi)]−0.5331).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.