Attachable/detachable probing tip system for a measurement probing system

US7056134B2 · kind B2 · utility

Assignee

• Tektronix, Inc. · US

Inventors

• Jim L. Martin · Lake Oswego, US
• Marc A. Gessford · Portland, US
• William R. Pooley · Beaverton, US
• William Q. Law · Beaverton, US
• Ira G. Pollock · Beaverton, US
• William A. Hagerup · Portland, US

Key dates

• Filing date: May 27, 2004
• Grant date: Jun 6, 2006
• Expiry date: Jul 19, 2024

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/06772
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A attachable/detachable probing tip system (10) has a housing (12) that includes a probing tip mounting member (14) and opposing substantially orthogonal attachment (16, 18) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member (56). First and second probing tips (42, 44) are disposed over the non-compressive, resilient member (56) and secured to the housing by latching means (60, 66, 92, 96, 100, 130). The attachable/detachable probing tip system allows mounting of the probing tips (42, 44) to probing contacts on a device under test without a probe body or probing tip member (38) being attached. The attachment arms (16, 18) allows a probe body or probing tip member (38) to be attached and detached to the probing tip system (10). The probing tip member (38) includes contact pins that engage contact areas (82, 82, 92) of the probing tips (42, 44).