Patent · US Expired

Position measuring device

US7057161B2 · kind B2 · utility

2Cited by
6References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 5, 2002
Grant dateJun 6, 2006
Priority date
Expiry dateAug 27, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D5/38
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A position measuring device having a scanning device and a scale, wherein the scanning device is movable in relation to the scale in a measuring direction. The scale including a measuring graduation, wherein periodic measuring signals are generated when the scanning device scans the measuring graduation and a reference marking, wherein a reference marking signal is generated when the scanning device scans the reference marking with a scanning beam bundle. The scale further includes a first optically scannable area marking next to the reference marking and a second optically scannable area marking next to the reference marking and which has a different optical deflection property than the first optically scannable area marking, wherein photoelectric scanning of the first and second optically scannable area markings with the scanning beam bundle from the scanning device generates an area signal that differentiates characteristics of the first and second optically scannable area markings. A first photo-receiver receives light from the first optically scannable area marking and a second photo-receiver receives light from the second optically scannable area marking.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.